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表单
powder
包装
pkg of 7.5 g
制造商/商品名称
NIST®
技术
diffraction/scattering: suitable
一般描述
The Standard Reference Material (SRM) was prepared from ultra-high purity, intrinsic silicon boules that were crushed and jet milled to a median particle size of 4.1μm. The resulting powder was then annealed under gettered argon at 1000 °C for two hours and bottled under argon.
SRM 640F_Cert
SRM 640F_SDS
SRM 640F_Cert
SRM 640F_SDS
应用
This SRM is intended for use as a standard for calibration of diffraction line positions and line shapes, determined through powder diffractometry.
特点和优势
- A unit of SRM 640f consists of approximately 7.5 g of silicon powder bottled under argon.
- Analysis of X-ray powder diffraction data indicated that the SRM material is homogeneous with respect to diffraction properties.
- SRM 640f was bottled under argon to protect against humidity.
- The certification data was analyzed using the FPA method with Pawley refinements as implemented in TOPAS.
- Expiration details and storage instructions are available in the NIST certificate.
其他说明
Please download a current certificate at nist.gov/SRM for current analytes and certified values.
法律信息
NIST is a registered trademark of National Institute of Standards and Technology
SRM is a registered trademark of National Institute of Standards and Technology
储存分类代码
11 - Combustible Solids
WGK
nwg
闪点(°F)
Not applicable
闪点(°C)
Not applicable
法规信息
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