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等级
certified reference material
质量水平
表单
solid
包装
pkg of 1 block
制造商/商品名称
NIST®
技术
diffraction/scattering: suitable
应用
general analytical
一般描述
Each unit of Standard Reference Material (SRM) contains 25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. For more information, please refer to the SDS and COA.
SRM 2000_cert
SRM 2000_SDS
SRM 2000_cert
SRM 2000_SDS
应用
This Standard Reference Material (SRM) offers the high-resolution X-ray diffraction (HRXRD) community SI-traceable Si (220) d-spacing in transmission, wafer miscut angle relative to the crystal plane, and the surface-to-Si (004) Bragg angle in reflection for the specified reference wavelength.
特点和优势
Certified values for SRM 2000 are available and can be used to calibrate HRXRD instrumentation. Expiration details, along with instructions for use, are included on the NIST certificate.
其他说明
Please download a current certificate at nist.gov/SRM for current analytes and certified values.
法律信息
NIST is a registered trademark of National Institute of Standards and Technology
SRM is a registered trademark of National Institute of Standards and Technology
储存分类代码
11 - Combustible Solids
WGK
nwg
闪点(°F)
Not applicable
闪点(°C)
Not applicable
法规信息
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