95381
Bismuth oxide
purum, ≥98.0% (KT)
别名:
三氧化二铋
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关于此项目
经验公式（希尔记法）:
Bi2O3
化学文摘社编号:
分子量:
465.96
NACRES:
NA.23
PubChem Substance ID:
UNSPSC Code:
12352303
EC Number:
215-134-7
MDL number:
产品名称
氧化铋 (III), purum, ≥98.0% (KT)
InChI key
WMWLMWRWZQELOS-UHFFFAOYSA-N
InChI
1S/2Bi.3O
SMILES string
O=[Bi]O[Bi]=O
grade
purum
assay
≥98.0% (KT)
form
crystals
reaction suitability
reagent type: catalyst
core: bismuth
loss
≤0.2% loss on ignition
Quality Level
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Features and Benefits
据报道，可由 V2O5、Bi2O3 和其他固体氧化物通过微波辅助法制备稳定的新型氧化离子导电性钒酸铋相。这些陶瓷在固体氧化物燃料电池、水蒸气电解器和氧传感器领域有极佳的应用前景。
存储类别
13 - Non Combustible Solids
wgk
nwg
ppe
dust mask type N95 (US), Eyeshields, Gloves
法规信息
新产品
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Lu You et al.
ACS nano, 6(6), 5388-5394 (2012-05-18)
The novel strain-driven morphotropic phase boundary (MPB) in highly strained BiFeO(3) thin films is characterized by well-ordered mixed phase nanodomains (MPNs). Through scanning probe microscopy and synchrotron X-ray diffraction, eight structural variants of the MPNs are identified. Detailed polarization configurations
Rifath Sharmin et al.
Journal of the Air & Waste Management Association (1995), 62(9), 1032-1039 (2012-10-02)
Photocatalytic oxidation (PCO) is a promising technology for indoor air purification due to low operating cost, potentially long service life, and low maintenance. Ultraviolet light-emitting diode (UVLED) is a new concept in the field of PCO, which has several advantages
L M Formosa et al.
International endodontic journal, 45(4), 326-336 (2011-11-03)
To investigate the physical properties of tricalcium silicate (TCS) with and without the addition of a radiopacifier and compare them with that of Portland cement (PC) and radiopaque PC in an mineral trioxide aggregate-like system. Tricalcium silicate, PC and radiopacified
V S Kopp et al.
Acta crystallographica. Section A, Foundations of crystallography, 68(Pt 1), 148-155 (2011-12-22)
X-ray diffraction from films consisting of layers with different thicknesses, structures and chemical contents is analysed. The disorder is described by probabilities for different sequences of layers. Closed analytical expressions for the diffracted X-ray intensity are obtained when the layers
Shuhong Xie et al.
Nanoscale, 4(2), 408-413 (2011-11-22)
Piezoresponse force microscopy (PFM) has emerged as the tool of choice for characterizing piezoelectricity and ferroelectricity of low-dimensional nanostructures, yet quantitative analysis of such low-dimensional ferroelectrics is extremely challenging. In this communication, we report a dual frequency resonance tracking technique
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