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Merck
CN
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主要文件

安全信息

42696

Supelco

分子筛标准品,可溯源到 NIST 标准参考物质

75 μm (200 mesh)

别名:

Sieve calibration standard, 75 μm (200 mesh)

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About This Item

UNSPSC代码:
41116107
NACRES:
NA.24

等级

analytical standard

表单

particles

制造商/商品名称

Whitehouse Scientific Ltd SS398

粒径

75 μm (200 mesh)

应用

glass & ceramic
industrial qc
pharmaceutical

包装形式

neat

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一般描述

Sieve Standard, traceable to NIST SRM is designed to find the particle size distribution (PSD) of a particle system.
The particle diameter of 75 μm (200 mesh) is evaluated using electroformed sieves and glass microsphere method.

应用

Used to develop and standardize surface scanning instruments and particle counters.
Also suitable for use:
  • as a sieve calibration standard in electroformed sieve particle size measurements
  • to sieve aluminum buffing residue in studies of dust explosion hazards

特点和优势

  • suitable for routine instrument calibration checks, testing and corrections
  • certified against NIST and SRM standards
  • available as a neat sample

储存分类代码

13 - Non Combustible Solids

WGK

WGK 3

闪点(°F)

Not applicable

闪点(°C)

Not applicable

个人防护装备

Eyeshields, Gloves, type N95 (US)

法规信息

新产品

历史批次信息供参考:

分析证书(COA)

Lot/Batch Number

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访问文档库

Reducing aluminum dust explosion hazards: case study of dust inerting in an aluminum buffing operation
Myers TJ
Journal of Hazardous Materials, 159(1), 72-80 (2008)
Sieve Calibration-a New Simple but High Precision Approach
Rideal GR, et al.
Particle & Particle Systems Characterization, 17(2), 77-82 (2000)

相关内容

Particle size conversion table from our Lab Basics Technical Library

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