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Merck
CN
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文件

16639

Supelco

镓ICP标准液

TraceCERT®, 1 g/L Ga in nitric acid (nominal concentration)

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UNSPSC代码:
41116107
NACRES:
NA.24

等级

certified reference material
TraceCERT®

质量水平

300

产品线

TraceCERT®

浓度

1 g/L Ga in nitric acid (nominal concentration)

技术

ICP: suitable

应用

industrial qc
pharmaceutical

格式

single component solution

相关类别

一般描述

This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.

Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.

Download your certificate at http://www.sigma-aldrich.com to view certified values, including uncertainty, date of expiry, and detailed information about trace impurities.

应用

Gallium standard was used as internal standard for analyzing serum using Total Reflection X-Ray Fluorescence using Synchrotron Radiation (SRTXRF) to determine the concentration of P, S, Cl, K, Ca, Fe, Cu, Zn, Br and Rb elements.

分析说明

溶于 5% 硝酸的 1000mg/L 的 Ga，用高纯 Ga 金属、HNO3 和 水制备。

其他说明

For a complete product listing of our TraceCERT® range of CRMs for ICP and AAS, technical information, and example certificates please visit our ICP & AAS standards website

法律信息

TraceCERT is a registered trademark of Merck KGaA, Darmstadt, Germany

象形图

Corrosion
GHS05

警示用语：

Danger

危险声明

H290,H314

危险分类

Eye Dam. 1 - Met. Corr. 1 - Skin Corr. 1B

补充剂危害

EUH071

WGK

WGK 2

闪点(°F)

Not applicable

闪点(°C)

Not applicable

个人防护装备

Faceshields, Gloves, Goggles, type ABEK (EN14387) respirator filter

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C G L Canellas et al.
Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine, 70(7), 1277-1280 (2012-03-01)
In this work we analyzed serum samples from patients with Sickle Cell Anemia (SCA) using Total Reflection X-Ray Fluorescence using Synchrotron Radiation (SRTXRF). The SRTXRF measurements were performed at the X-Ray Fluorescence Beamline at the Brazilian National Synchrotron Light Laboratory

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