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FIPMS990

Sigma-Aldrich

OFET Miniprober

Measuring Adaptor for Back-Gated OFET Interdigitated Substrates

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About This Item

UNSPSC代码:
43211915

包装

pkg of 1 ea

一般描述


  • Size: 120 x 110 x 35 mm3
  • Probcard size: 40 x 76 x 17 mm3
  • Material: aluminum C250, FR4; plastics
  • Probcard type: “OFET”,2 pieces miniature spring contact 6A
  • Weight: 280g
  • Connection: BNC panel jack

应用

For material scientists in the field of organic semiconductors, it is critically important to have standardized device architecture for material analysis.

In order to simply and quickly measure OFET components with a given substrate size, pad grid and pad arrangement in large batches, this miniprober was developed.

It has two electric connections on the front (source and drain) and one connection on the back (gate) and does not require probe station, samplers or manipulator pins.

A reliable interconnection is established on contact pads, which are only 0.5 × 0.5 mm² in size. Customized versions of the miniprober varying the connection arrangement, the position and number of the pads are possible. This makes the miniprober suitable for other applications in addition to OFETs. Signals are transmitted to the measurement instrument by BNC or triax cables.

特点和优势

Advantages of the OFET Miniprober are:
  • No probing system required
  • Easy DUT handling
  • Stable and secure connection

包装

in foamed plastic case, packed with manual

制备说明

Contact check with microscope is recommended.

法律信息

Product of Fraunhofer IPMS

法规信息

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