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Merck
CN

634867

二氧化硅

single crystal substrate, optical grade, 99.99% trace metals basis, L × W × thickness 10 mm × 10 mm × 0.5 mm

别名:

方石英, 石英, 砂石, 硅石

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关于此项目

线性分子式:
SiO2
化学文摘社编号:
60676-86-0
分子量:
60.08
NACRES:
NA.23
PubChem Substance ID:
24882697
UNSPSC Code:
12352303
EC Number:
262-373-8
MDL number:
MFCD00011232

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产品名称

二氧化硅, single crystal substrate, optical grade, 99.99% trace metals basis, L × W × thickness 10 mm × 10 mm × 0.5 mm

InChI

1S/O2Si/c1-3-2

InChI key

VYPSYNLAJGMNEJ-UHFFFAOYSA-N

SMILES string

O=[Si]=O

grade

optical grade

assay

99.99% trace metals basis

form

solid

hardness

7.0 mohs

L × W × thickness

10 mm × 10 mm × 0.5 mm

refractive index

n20/D 1.544 (lit.)

mp

1610 °C (lit.)

transition temp

Tm 573.1 °C (phase change)

density

2.6 g/mL at 25 °C (lit.)
2.684 g/mL

Quality Level

100

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相关类别

Application

SiO2因其绝佳的热机械性能而作为基质材料用于一系列的应用，包括：
  • 气相沉积
  • 相沉积
  • 原子力显微镜探针（AFM）
  • 旋涂
  • 电子设备

Features and Benefits

应用于无线通信领域的微波滤波器的出色基片。

Other Notes

比热 = 0.18 cal/g；热电常数 = 1200μV/°C @ 300 °C；热导率 = 0.0033 cal/cm°C；热膨胀 (x10-6) = α；11: 13.71, α33: 7.48；Q值 = 1.8 × 106 min；音速，SAW = 3160 m/sec; 频率常数，BAW = 1661 kHz/mm；压电耦合 = K2 BAW: 0.65%, SAW: 0.14%

Physical form

六角形结晶（a = 4.914 Å, c = 5.405 Å）

存储类别

13 - Non Combustible Solids

wgk

nwg

flash_point_f

Not applicable

flash_point_c

Not applicable

ppe

dust mask type N95 (US), Eyeshields, Gloves

历史批次信息供参考:

分析证书(COA)

Lot/Batch Number
BCCL7789
BCCK3793
BCCK8737
BCCH5972
BCCD6553

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Measurement of the adhesion force between carbon nanotubes and a silicon dioxide substrate.
Whittaker JD, et al.
Nano Letters, 6(5), 953-957 (2006)
Oxygen-aided synthesis of polycrystalline graphene on silicon dioxide substrates.
Chen J, et al.
Journal of the American Chemical Society, 133(44), 17548-17551 (2011)
Growth model of bamboo-shaped carbon nanotubes by thermal chemical vapor deposition.
Lee CJ and Park J
Applied Physics Letters, 77(21), 3397-3399 (2000)
The effect of calcination temperature on the surface microstructure and photocatalytic activity of TiO2 thin films prepared by liquid phase deposition.
Yu J, et al.
The Journal of Physical Chemistry B, 107(50), 13871-13879 (2003)
Exciton diffusion measurements in poly (3-hexylthiophene).
Shaw PE, et al.
Advanced Materials, 20(18), 3516-3520 (2008)
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