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Merck
CN

266922

foil, thickness 0.1 mm, ≥99.9% trace metals basis

别名:

钼元素

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关于此项目

经验公式(希尔记法):
Mo
化学文摘社编号:
分子量:
95.94
NACRES:
NA.23
PubChem Substance ID:
UNSPSC Code:
12141727
EC Number:
231-107-2
MDL number:
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产品名称

钼, foil, thickness 0.1 mm, ≥99.9% trace metals basis

InChI key

ZOKXTWBITQBERF-UHFFFAOYSA-N

InChI

1S/Mo

SMILES string

[Mo]

assay

≥99.9% trace metals basis

form

foil

resistivity

5.0 μΩ-cm, 20°C

thickness

0.1 mm

bp

4612 °C (lit.)

mp

2617 °C (lit.)

density

10.3 g/mL at 25 °C (lit.)

Quality Level

General description

钼箔的重量轻且柔韧,因此适用于空间应用。钼箔可以用作制造CdS-CdTe太阳能电池的基质。 已通过原子吸收光谱研究了硒、砷氢化物、锑和铋与钼箔的相互作用。钼箔可用于生成碳化硅/碳化硅(SiC/SiC)接头中的金属扩散连接。

Preparation Note

100×100 mm (约10.2 g)

存储类别

13 - Non Combustible Solids

wgk

nwg

flash_point_f

Not applicable

flash_point_c

Not applicable

ppe

Eyeshields, Gloves, type P3 (EN 143) respirator cartridges


历史批次信息供参考:

分析证书(COA)

Lot/Batch Number

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Flexural Strength and Shear Strength of Silicon Carbide to Silicon Carbide Joints Fabricated by a Molybdenum Diffusion Bonding Technique.
Cockeram BV, et al.
Journal of the American Ceramic Society. American Ceramic Society, 88(7), 1892-1899 (2006)
Design issues in the fabrication of CdS?CdTe solar cells on molybdenum foil substrates.
Singh VP and McClure JC
Solar Energy Materials and Solar Cells, 76, 363-385 (2003)
Trapping of hydride forming elements within miniature electrothermal devices: part I. investigation of collection of arsenic and selenium hydrides on a molybdenum foil strip
Docekal B and Selecka A
Spectrochimica Acta. Part B: Atomic Spectroscopy, 59(4), 487-495 (2004)
Trapping of hydride forming elements within miniature electrothermal devices. Part 3. Investigation of collection of antimony and bismuth on a molybdenum foil strip following hydride generation
Krejci P, et al.
Spectrochimica Acta. Part B: Atomic Spectroscopy, 61, 444-449 (2006)
Reply to 'Measurement of mobility in dual-gated MoS₂ transistors'.
B Radisavljevic et al.
Nature nanotechnology, 8(3), 147-148 (2013-03-06)

商品

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