推荐产品
质量水平
方案
99% trace rare earth metals basis
表单
(powder or filings)
反应适用性
reagent type: catalyst
core: samarium
电阻率
91.4 μΩ-cm, 0°C
粒径
−40 mesh
沸点
1794 °C (lit.)
mp
1074 °C (lit.)
密度
7.47 g/mL at 25 °C (lit.)
SMILES字符串
[Sm]
InChI
1S/Sm
InChI key
KZUNJOHGWZRPMI-UHFFFAOYSA-N
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应用
通过联合使用氯化钐和氯化钛(IV) 还原芳基磺酰氯和芳基亚磺酸盐，制备二芳基二硫化物。
警示用语：
Warning
危险声明
危险分类
Flam. Sol. 2 - Water-react 3
储存分类代码
4.3 - Hazardous materials which set free flammable gases upon contact with water
WGK
WGK 3
闪点(°F)
Not applicable
闪点(°C)
Not applicable
法规信息
监管及禁止进口产品
Wang, J. Zhang, Y.
Synthetic Communications, 26, 135-135 (1995)
Hua Yang et al.
Inorganic chemistry, 52(3), 1275-1284 (2013-01-25)
Sm@C(2v)(3)-C(80) has been separated from the carbon soot produced by electrical arc vaporization of graphite rods doped with Sm(2)O(3) and purified. Its structure has been determined by single crystal X-ray diffraction using cocrystals obtained from either Ni(II)(octaethylporphyrin) (Ni(II)(OEP)) to form
M Majumder et al.
Journal of physics. Condensed matter : an Institute of Physics journal, 25(2), 025701-025701 (2012-12-05)
We report resistivity, magnetization and (19)F NMR results in a polycrystalline sample of SmFeAsO(0.86)F(0.14). The resistivity and magnetization data show a sharp drop at 48 K indicating a superconducting transition. The nuclear spin-lattice rate (1/T(1)) and spin-spin relaxation rate (1/T(2))
T Sasikala et al.
Spectrochimica acta. Part A, Molecular and biomolecular spectroscopy, 104, 445-450 (2013-01-01)
Glasses with chemical composition of (62-x) TeO(2)+25 ZnO+8 K(2)O+5 CaO+x Sm(2)O(3) (TZKCSmx; x=0.1, 0.5, 1.0, 1.5 mol%) were prepared by melt quenching technique. The absorption spectrum was recorded in the UV-visible and NIR regions. The oscillator strengths of absorption bands
M Saif et al.
Chemosphere, 90(2), 840-847 (2012-11-06)
Highly active samarium doped zinc oxide self-cleaning and biocidal surfaces (x mol% Sm(3+)/ZnO where x=0, 1, 2 and 4 mol%) with crystalline porous structures were synthesized by hydrothermal method. Sm(3+)/ZnO thin films were characterized by X-ray diffraction (XRD), transmission electron
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