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General description
EMS techware
Application
Used for clamping in scanning electron microscope (SEM). It accommodates four pin type, up to 12.5 (½") surface specimen stubs, with ⅛" (3.1 mm) diameter pin.
Regulatory Information
新产品
Certificates of Analysis (COA)
Search for Certificates of Analysis (COA) by entering the products Lot/Batch Number. Lot and Batch Numbers can be found on a product’s label following the words ‘Lot’ or ‘Batch’.
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