334103
Silicon nitride
powder, ≥99.9% trace metals basis
Synonym(s):
Trisilicon tetranitride
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About This Item
Linear Formula:
Si3N4
CAS Number:
Molecular Weight:
140.28
NACRES:
NA.23
PubChem Substance ID:
UNSPSC Code:
12352300
EC Number:
234-796-8
MDL number:
Product Name
Silicon nitride, powder, ≥99.9% trace metals basis
InChI key
HQVNEWCFYHHQES-UHFFFAOYSA-N
InChI
1S/N4Si3/c1-5-2-6(1)3(5)7(1,2)4(5)6
SMILES string
N12[Si]34N5[Si]16N3[Si]25N46
assay
≥99.9% trace metals basis
form
powder
particle size
<1 μm
density
3.44 g/mL at 25 °C (lit.)
Quality Level
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General description
Silicon nitride based ceramics possess high fracture toughness, hardness and wear resistance, resistance to corrosion, thermal stability. Two known polymorphs of silicon nitride exist, alpha and beta Si3N4, both have hexagonal structure. A study shows that a third state, cubic spinel structure, has also been synthesized.
Storage Class
11 - Combustible Solids
wgk
nwg
flash_point_f
Not applicable
flash_point_c
Not applicable
ppe
dust mask type N95 (US), Eyeshields, Gloves
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Synthesis of cubic silicon nitride
Zerr A, et al
Nature, 400, 340-342 null
Silicon Nitride and Related Materials
Riley FR
Journal of the American Ceramic Society. American Ceramic Society, 83(2), 245-265 (2000)
Simone P Rodrigues et al.
Journal of materials science. Materials in medicine, 24(1), 231-239 (2012-10-12)
Commercial femoral head prostheses (cobalt-chromium alloy, yttria partially stabilized zirconia (Y-PSZ) and alumina) and new silicon nitride ceramic ones (nanocrystalline diamond coated and uncoated) were compared in terms of artifact level production by computed tomography (CT). Pelvis examination by CT
Chang-Hyun Park et al.
Optics express, 20(21), 23769-23777 (2012-11-29)
A nanophotonic polarization-independent visible wavelength filter is presented, incorporating a symmetric metal-dielectric resonant structure on quartz substrate, where a sub-wavelength grating, made up of a two-dimensional array of Al square sheets, is integrated with a Si(3)N(4) slab waveguide via an
Tingyin Ning et al.
Optics express, 21(2), 2012-2017 (2013-02-08)
We report on strong UV third-harmonic generation from silicon nitride films and resonant waveguide gratings. We determine the absolute value of third-order susceptibility of silicon nitride at wavelength of 1064 nm to be χ(³) (-3ω,ω,ω,ω) = (2.8 ± 0.6) ×
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