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Merck
CN

266752

Hafnium

powder, −325 mesh, 99.5% trace metals basis (purity excludes ~2% zirconium), contains 1:10 pentanol to water solution as stabilizer

Synonym(s):

Celtium, Hafnium element

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About This Item

Empirical Formula (Hill Notation):
Hf
CAS Number:
7440-58-6
Molecular Weight:
178.49
NACRES:
NA.23
PubChem Substance ID:
24856157
UNSPSC Code:
12352300
EC Number:
231-166-4
MDL number:
MFCD00011032

Key Documents

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InChI key

VBJZVLUMGGDVMO-UHFFFAOYSA-N

InChI

1S/Hf

SMILES string

[Hf]

assay

99.5% trace metals basis (purity excludes ~2% zirconium)

form

powder

contains

1:10 pentanol to water solution as stabilizer

resistivity

29.6 μΩ-cm, 0°C

particle size

−325 mesh

bp

4602 °C (lit.)

mp

2227 °C (lit.)

density

13.3 g/cm3 (lit.)

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pictograms

Flame
GHS02

signalword

Danger

hcodes

H228,H250

Hazard Classifications

Flam. Sol. 1 - Pyr. Sol. 1

Storage Class

4.2 - Pyrophoric and self-heating hazardous materials

wgk

WGK 3

flash_point_f

Not applicable

flash_point_c

Not applicable

Regulatory Information

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Certificates of Analysis (COA)

Lot/Batch Number
MKCK9646
MKBX3998V
MKBV7523V
MKBR9046V
MKBQ2316V

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Laurence Maggiorella et al.
Future oncology (London, England), 8(9), 1167-1181 (2012-10-04)
There is considerable interest in approaches that could improve the therapeutic window of radiotherapy. In this study, hafnium oxide nanoparticles were designed that concentrate in tumor cells to achieve intracellular high-energy dose deposit. Conventional methods were used, implemented in different
Célia Lourenço et al.
The journal of physical chemistry. A, 116(51), 12399-12405 (2012-11-29)
Fourier transform ion cyclotron resonance mass spectrometry was used to characterize the gas-phase reactivity of Hf dipositive ions, Hf(2+)and HfO(2+), toward several oxidants: thermodynamically facile O-atom donor N(2)O, ineffective donor CO, and intermediate donors O(2), CO(2), NO, and CH(2)O. The
Gerald Lucovsky et al.
Journal of nanoscience and nanotechnology, 12(6), 4811-4819 (2012-08-22)
Performance and reliability in semiconductor devices are limited by electronically active defects, primarily O-atom and N-atom vacancies. Synchrotron X-ray spectroscopy results, interpreted in the context of two-electron multiplet theories, have been used to analyze conduction band edge, and O-vacancy defect
Tingting Zhao et al.
Journal of biomedical materials research. Part B, Applied biomaterials, 100(3), 646-659 (2011-11-29)
Hafnium ion implantation was applied to NiTi alloy to suppress Ni ion release and enhance osteoblast-material interactions and hemocompatibility. The auger electron spectroscopy, x-ray photoelectron spectroscopy, and atomic force microscope results showed that a composite TiO(2)/HfO(2) nanofilm with increased surface
Daqin Chen et al.
Chemical communications (Cambridge, England), 48(86), 10630-10632 (2012-09-27)
Novel Yb/Er(Tm):Na(3)MF(7) (M = Zr, Hf) nanocrystals with intrinsic single-band upconversion emission, in contrast to the routine lanthanide-doped fluoride nanocrystals which show typical multi-band upconversion emissions, are reported for the first time. Specifically, the red upconversion intensity of the Yb/Er:Na(3)ZrF(7)
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